RIXS Endstation

The RIXS Endstation is Currently Operational


The RIXS endstation for x-ray emission spectroscopy and resonant inelastic x-ray scattering is a synchrotron-based tool to study the electronic structure of new materials. It will allow access to new information on chemical state, electronic structure or best possible synthesis of the systems. This research will ultimately lead to novel devices like sensors with advanced and tailored optical, electronic, magnetic and catalytic properties.

The RIXS endstation was constructed by the Moewes group, U of S. At the core of the endstation is a large custom designed Rowland circle spectrometer. It will use 4 diffraction gratings to cover an energy range of 80 eV – 1000 eV with good efficiency and resolving powers (E/ΔE) in the range of 1,000 - 2,000.  The spectrometer will use a high resolution microchannel plate detector, mounted inside a translating vacuum chamber. Two additional gratings, specifically designed to operate in the third diffraction order, will provide resolving powers in excess of 10,000 at those emission edges. In order reach the large focal distances required by the third diffraction order gratings a second detector is used specifically for the third order gratings.

The optical design was carefully optimized using a novel approach employing software and analysis techniques developed specifically for this project. By considering the diffraction efficiency and dispersion characteristics of each grating, a spectrometer design with extremely high resolving power and high throughput was achieved. Along with the spectrometer for soft X-ray emission spectroscopy (XES) and Resonant Inelastic X-ray Scattering (RIXS), the endstation also includes instrumentation for soft X-ray Absorption Spectroscopy (XAS) using Partial- and Total- Fluorescence Yield (PFY & TFY) and Total Electron Yield (TEY).

NOTE: Currently, the third order gratings are still be commissioned. Please contact beamline staff before planning your experiment.


RIXS Endstation Techniques

X-ray Emission Spectroscopy (XES) and Resonant Inelastic X-ray Scattering (RIXS):

Four commissioned gratings are currently available. The LEG and MEG cover a range of 80 eV - 800 eV. The HEG covers a range from 500 eV - 1000 eV with improved resolving power. The IMP grating which covers a similar range, 100 eV - 650 eV, with higher efficiency and lower resolution for faster measurements or otherwise un-measurable, low concentration samples.

X-ray Absorption Spectroscopy (XAS/NEXAFS/XANES)

Total Electron Yield (TEY) and Total Fluorescence Yield (TFY) are operational, with the TFY making use of a CEM. Partial Fluorescence Yield (PFY) is implemented and provides vastly improved data quality. An SDD is available for the energy range of 300 eV - 2000 eV. Additionally, the spectrometer is also available as detector capable of PFY, practically, from 100 - 800 eV.

Sample Environment 

Sample cooling with liquid nitrogen is available, reaching 80K.  Liquid helium cooling is also avialable with a lower limit of approximately 30 K.  Sample heating to ~400K is also available.

Sample plates that provide magnetic fields are also available, but are currently being commissioned. Please contact beamline if you are interested in either X-ray Magnetical Ciruclar Dischroism (XMLD) or X-ray Magentic Linear Dichroism (XMLD) measurements.

Useful Documents

Resolving Power

Spectrometer Relative Efficiency

Example Spectra