This endstation offers several techniques:

Resonant soft x-ray scattering and x-ray reflectometry

• 11-motion UHV diffractometer: 4-circle diffractometer, x,y,z translation, and several detector motions.
• Detectors: channeltron, photodiode (with multiple slits and filters), 2D micro-channelplate (MCP), Silicon drift detector (SDD), and polarization analyzer with 4 multilayers.
• Sample environment: P ~ 3x10^-10 Torr, closed-cycle cryostat for variable sample temperature environment (20 K – 380 K), permanent magnet sample holder, load-lock with crystal-cleaver/scraper or heating stage (up to 400 C).
• The diffractometer is controlled by spec software from Certified Scientific Software.

X-ray Absorption Spectroscopy (XAS)

• Total electron yield (TEY)
• Total fluorescence yield (TFY)
• Partial fluorescence yield (PFY)

X-ray Magnetic Circular and Linear Dichorism (XMCD and XMLD)

• Full polarization control of the incoming beam
• Variable magnetic field with a Hallbach array permanent magnet configuration

A vacuum suitcase is available for transfering samples under vacuum between the RSXS endstation and the Surface Science Facility (MBE-Surface analysis)

It is also possible to apply voltage bias up to 500 V