This endstation offers several techniques:
Resonant soft x-ray scattering and x-ray reflectometry
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11-motion UHV diffractometer: 4-circle diffractometer, x,y,z translation, and several detector motions.
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Detectors: channeltron, photodiode (with multiple slits and filters), 2D micro-channelplate (MCP), Silicon drift detector (SDD), and polarization analyzer with 4 multilayers.
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Sample environment: P ~ 3x10-10 Torr, closed-cycle cryostat for variable sample temperature environment (20 K – 380 K), permanent magnet sample holder, load-lock with crystal-cleaver/scraper or heating stage (up to 400 C).
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The diffractometer is controlled by spec software from Certified Scientific Software.
X-ray Absorption Spectroscopy (XAS)
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Total electron yield (TEY)
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Total fluorescence yield (TFY)
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Partial fluorescence yield (PFY)
X-ray Magnetic Circular and Linear Dichorism (XMCD and XMLD)
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Full polarization control of the incoming beam
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Variable magnetic field with a Hallbach array permanent magnet configuration
A vacuum suitcase is available for transfering samples under vacuum between the RSXS endstation and the Surface Science Facility (MBE-Surface analysis)
It is also possible to apply voltage bias up to 500 V
